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A dual-substrate X-ray CT platform for in situ high-resolution and high-throughput phenotyping of crop root systems

PLANT PHYSIOLOGY · 1 Jul 2026 · 10.1093/plphys/kiag197

Abstract

A dual-substrate X-ray CT platform using high-contrast media and modular scanning overcomes traditional resolution and size limits to enable large-scale, high-resolution 3D in situ root phenotyping.

Plant phenotyping relevance

作物根系のin situ表現型測定を目的とするX線CTプラットフォームの開発であり、取得・解析手法が研究の中心である。

abstractA dual-substrate X-ray CT platform using high-contrast media and modular scanning overcomes traditional resolution and size limits to enable large-scale, high-resolution 3D in situ root phenotyping.

Code and data availability

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