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Ranking Quantitative Resistance to Septoria tritici Blotch in Elite Wheat Cultivars Using Automated Image Analysis.

Phytopathology · 4 Apr 2018 · 10.1094/phyto-04-17-0163-r

Abstract

Quantitative resistance is likely to be more durable than major gene resistance for controlling Septoria tritici blotch (STB) on wheat. Earlier studies hypothesized that resistance affecting the degree of host damage, as measured by the percentage of leaf area covered by STB lesions, is distinct from resistance that affects pathogen reproduction, as measured by the density of pycnidia produced within lesions. We tested this hypothesis using a collection of 335 elite European winter wheat cultivars that was naturally infected by a diverse population of Zymoseptoria tritici in a replicated field experiment. We used automated image analysis of 21,420 scanned wheat leaves to obtain quantitative measures of conditional STB intensity that were precise, objective, and reproducible. These measures allowed us to explicitly separate resistance affecting host damage from resistance affecting pathogen reproduction, enabling us to confirm that these resistance traits are largely independent. The cultivar rankings based on host damage were different from the rankings based on pathogen reproduction, indicating that the two forms of resistance should be considered separately in breeding programs aiming to increase STB resistance. We hypothesize that these different forms of resistance are under separate genetic control, enabling them to be recombined to form new cultivars that are highly resistant to STB. We found a significant correlation between rankings based on automated image analysis and rankings based on traditional visual scoring, suggesting that image analysis can complement conventional measurements of STB resistance, based largely on host damage, while enabling a much more precise measure of pathogen reproduction. We showed that measures of pathogen reproduction early in the growing season were the best predictors of host damage late in the growing season, illustrating the importance of breeding for resistance that reduces pathogen reproduction in order to minimize yield losses caused by STB. These data can already be used by breeding programs to choose wheat cultivars that are broadly resistant to naturally diverse Z. tritici populations according to the different classes of resistance.

Plant phenotyping relevance

小麦葉の病害症状と病原菌繁殖を自動画像解析で定量化し、精度・客観性・再現性を評価するとともに、従来の目視評価と比較しているため、植物表現型取得法が研究の中心である。

abstractWe used automated image analysis of 21,420 scanned wheat leaves to obtain quantitative measures of conditional STB intensity that were precise, objective, and reproducible.
abstractWe showed that measures of pathogen reproduction early in the growing season were the best predictors of host damage late in the growing season
abstractWe found a significant correlation between rankings based on automated image analysis and rankings based on traditional visual scoring

Code and data availability

The paper explicitly deposits its full automated image analysis phenotype dataset (PLACL, rlesion, rleaf, pycnidia counts, visual scores) in the Dryad Digital Repository with a public DOI, making it a paper-specific, publicly actionable asset. The scipy and agrometeo.ch URLs are generic libraries/external weather data,

Datasetpublic

m2 was recognized as damaged by STB. The mean analyzed area of an individual leaf was 17 cm2. In total, 2.7 million pycnidia were counted. The mean number of pycnidia within a leaf was 127. A more detailed description of the overall dataset is given in Table 2. The full dataset can be accessed from the Dryad Digital Repository: https://doi.org/10.5061/dryad.171q4. Correlations between the two biological replicates ranged from 0.23 to 0.66, with P values ranging from 10_4 to 10_35 (Fig. A3; see Appendix, “Correlation between replicates”, for more details). Thedistributionsoftheraw datapointscorrespondingtoindividual leaves withrespect toPLACL, rlesion, and rleaf are showninFigures 2 and

Open resource ↗Dryad Digital Repository · 10.5061/dryad.171q4 · pdf-raw-page:5 lines:80-131

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