Unverified paper record
Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy.
Sensors (Basel, Switzerland) · 8 Jan 2023 · 10.3390/s23020707
Abstract
Non-destructive measurements of internal morphological structures in plant materials such as seeds are of high interest in agricultural research. The estimation of pericarp thickness is important to understand the grain quality and storage stability of seeds and can play a crucial role in improving crop yield. In this study, we demonstrate the applicability of fiber-based Bessel beam Fourier domain (FD) optical coherence microscopy (OCM) with a nearly constant high lateral resolution maintained at over ~400 µm for direct non-invasive measurement of the pericarp thickness of two different sorghum genotypes. Whereas measurements based on axial profiles need additional knowledge of the pericarp refractive index, en-face views allow for direct distance measurements. We directly determine pericarp thickness from lateral sections with a 3 µm resolution by taking the width of the signal corresponding to the pericarp at the 1/e threshold. These measurements enable differentiation of the two genotypes with 100% accuracy. We find that trading image resolution for acquisition speed and view size reduces the classification accuracy. Average pericarp thicknesses of 74 µm (thick phenotype) and 43 µm (thin phenotype) are obtained from high-resolution lateral sections, and are in good agreement with previously reported measurements of the same genotypes. Extracting the morphological features of plant seeds using Bessel beam FD-OCM is expected to provide valuable information to the food processing industry and plant breeding programs.
Plant phenotyping relevance
BesselビームFD-OCMを用いてソルガム種子の果皮厚を非破壊・直接計測する画像計測法を実証し、解像度と分類精度も評価しており、植物形質取得法が研究の中心です。
abstractwe demonstrate the applicability of fiber-based Bessel beam Fourier domain (FD) optical coherence microscopy (OCM) with a nearly constant high lateral resolution maintained at over ~400 µm for direct non-invasive measurement of the pericarp thickness of two different sorghum genotypes.
abstractWe directly determine pericarp thickness from lateral sections with a 3 µm resolution by taking the width of the signal corresponding to the pericarp at the 1/e threshold.
abstractThese measurements enable differentiation of the two genotypes with 100% accuracy.
Code and data availability
The paper describes in-house LabVIEW acquisition software and an in-house MATLAB processing script for OCM tomogram analysis, but no public deposit, repository, or availability statement for data, images, or code is provided in the supplied blocks. The only public URL cited (MIMMS 2.1 at Janelia) is a third-party laser
No evidence-backed public reproduction asset is currently recorded.
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