Terahertz probing of sunflower leaf multilayer organization.

Abstract

We analyze the multilayer structure of sunflower leaves from Terahertz data measured in the time-domain at a ps scale. Thin film reverse engineering techniques are applied to the Fourier amplitude of the reflected and transmitted signals in the frequency range f < 1.5 Terahertz (THz). Validation is first performed with success on etalon samples. The optimal structure of the leaf is found to be a 8-layer stack, in good agreement with microscopy investigations. Results may open the door to a complementary classification of leaves.

Plant phenotyping relevance

テラヘルツ時域計測と薄膜逆解析によりヒマワリ葉の多層構造を推定する手法を開発・検証しており、葉の形態状態の取得が研究の中心である。

Code and data availability

The supplied blocks contain no public phenotype/trait datasets, plant images, sensor data files, author analysis code, or trained models. The paper describes THz-TDS measurements of sunflower leaves and a Matlab-implemented RET algorithm, but no data or code availability statement, repository, or public URL for these资产

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