← Papers

Unverified paper record

Leaf Navigated Plant Growth Measurement for Automated Plant Cultivation System

2024 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) · 20 Sept 2024 · 10.1109/icwapr63074.2024.10870512

Abstract

This manuscript describes a workflow for automatically measuring plant growth from scanned images. To explore the different conditions of plant growth, botanists sow seeds in trays and use imaging devices such as scanners or cameras to record the daily growth of plants. Previous methods behave poorly in root measuring. To design an automated plant growth measurement system, we propose a leaf-root distance-based plant organ measurement method that finds the paths of the root by minimizing the distance energy from the root endpoints to the leaves. This method contains three modules. The first is a deep learning-based plant detection module to detect individual plants' regions of interest (ROI). An organ mask generation module that uses Otsu-thresholding to segment root and leaf. A plant organ analysis module to generate plant phenotypes (e.g., length of primary and lateral roots) from mask images. The experimental results showed that the proposed method had a higher measurement accuracy than previous methods.

Plant phenotyping relevance

植物のスキャン画像から根・葉を抽出し、根長などの表現型を自動測定する手法の開発と精度比較が中心であるため、収録対象です。

abstractThis manuscript describes a workflow for automatically measuring plant growth from scanned images.
abstractwe propose a leaf-root distance-based plant organ measurement method
abstractA plant organ analysis module to generate plant phenotypes (e.g., length of primary and lateral roots) from mask images.
abstractThe experimental results showed that the proposed method had a higher measurement accuracy than previous methods.

Code and data availability

公開本文の所在を確認できませんでした。非公開または購読が必要な可能性があります。

No evidence-backed public reproduction asset is currently recorded.

This is an automatically classified, unverified record. Curator approval is required before any resource enters the Catalog.